Transparent film measurements



I was wondering if there is a way to accurately measure transparent thin films or even stacks of transparent films? Since reflected signal is interference not only from one, but from multiple interfaces, can we trust height measurements in such conditions? Are there any steps we can take to, for example, measure the profile of the top (thin film/air) interface?


Hello Niklas,

The standard way to defeat multiple reflections is to coat your sample with a thin (~50nm) metal film. One could also study transparent layer stacks with one of our spectral reflectance systems. For example our F20: . I hope this helps.


Hello JimE,

Thank you for the suggestions!